Multi-Equipment Bid Bench Top SEM, XPS System, and FIB SEM
Background SUNY Polytechnic Institute is seeking bids from responsible and responsive vendors to provide a Bench Top Scanning Electron Microscope (SEM), X-Ray Photoelectron Spectroscopy (XPS) System, and Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for use in an educational setting. The goal of this procurement is to enhance the institute's capabilities in material characterizatio…
Source
Dates
Eligibility
Supporting Links
Documents
Get the full picture on this opportunity
Create a free Scout account to unlock everything you need to decide fast and win the grant.
-
Instant Fit Analysis
Let our grant expert AI score how well this opportunity aligns with your organization, strengths, gaps, and how to improve your chances of winning funding.
-
Deep agency & funder detail
Program context, sub-agency structure, and a full eligibility breakdown.
-
Source links & full documents
Jump straight to the solicitation and download every attachment.
-
Similar opportunities
Discover related funding matched to your work.
Already have an account? Sign In
Trusted by 500+ Happy Customers