Defect Metrology and Charge Trapping Dynamics in Transfer-Doped Diamond Transistors
The opportunity focuses on creating a new, non-destructive metrology method and lab apparatus for diamond semiconductor devices. The goal is to detect, quantify, and localize charge-trapping defects in transfer-doped diamond transistors and to characterize the trap energies behind current collapse in surface-channel operation. This is aimed at improving understanding and mitigation of reliabil…
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